DEFINITY ECS Release 8.2 Maintenance for R8.2csi
555-233-119 Issue 1
April 2000
Maintenance Objects

3-338CARD-MEM (Memory Card)

3
Memory Card Translation Data Integrity Test (#694)

This test, which is nondestructive, veri fies the integrity of the translation file stored

in the memory card by read ing (without any PREC updates) the translation file

from the memory card and b y then performing a c hecksum error chec king. The

calculated c hecksum value is comp ared with the recorded c hecksum value in

the translation file. If these two values are different, this ind icates that the

translation file is corrupted .

2117 ABORT No translation file has been saved onto the memory card.
1. Enter the save translation command, and verify that the translations are
saved onto the memory card successfully.
2. Retry the command at 1-minute intervals a maximum of 5 times.
104 FAIL Directories on the memory c ard are corrupt ed and cannot b e recovered.
105 FAIL "0" cannot be written into memory before an erase operation.
106 FAIL Memory c ard cannot be erased.
107 FAIL Data c annot be written onto a memory card after an erasure.
1. Replace the memory card and re-run the test.
108 FAIL 12-volt power supply for the Memory Card Erase/Write/Read Test can’t be
turned on. The 12-volt power supply on Processor circuit pack may be
defective.
1. Re-enter the test card-mem command, and verify the result of Test #701
for the 12 Volt Power Supply.
2. If Test #701 fails, follow the Standard Repair Procedure to replace the
Processor circuit pack.
3. Retry the command a 1-minute intervals a maximum of 5 times.
Table 3-147. TEST #694 Memory Card Translation Data Integrity Test
Error
Code
Test
Result Description/ Recommendation
2012
2106
2114
ABORT Internal system error
1. Retry the command at 1-minute intervals a maximum of 5 times.
Continued on next page
Table 3-146. TEST #693 Memory Card Erase/Write/Read Test — Continued
Error
Code
Test
Result Description/ Recommendation
Continued on next page